The external ion beam analysis end-station integrates the analytical capabilities of the PIXE, RBS and PIGE ion beam analysis techniques in one experimental set-up, so that to attain a complete elemental and near surface structural characterization of samples in an almost non-destructive way and without any limitation concerning their size or conductive state. The set-up experimental was developed to be used with protons as well as with heavier ions. Probe dimensions down to ≈1 mm2 can be analyzed.
It uses simultaneously five spectrometers; two for the implementation of PIXE by utilizing newly acquired Silicon Drift detectors (SDDs) with 30mm2 and 150 mm2 active areas supported by digital pulse processors, one for RBS/NRA, one for PIGE, whereas an additional miniature SDD X-ray detector is also employed for dose monitoring purposes. The exit ion-beam nozzle through appropriate collimation confines the ion beam size (≈1mm at the analysis point), whereas the selected exit window (100 nm Si3N4 thin film) and the short distance (≈5mm), in which the charged particles travel across the air path, minimize the ion beam energy loss and the straggling effect.
